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Book Chapter
Debug data reduction techniques
Sandeep Chandran
,
P.R. Panda
Published in Springer International Publishing
2018
DOI:
10.1007/978-3-319-98116-1_11
Pages: 211 - 229
Topics:
Post-silicon validation
(57)%
57% related to the paper
,
Lossy compression
(52)%
52% related to the paper
and
Lossless compression
(51)%
51% related to the paper
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Debug Data Reduction Techniques
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Post-Silicon Validation and Debug
Publisher
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Springer International Publishing
Authors (1)
Sandeep Chandran
Department of Computer Science and Engineering
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