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Modeling of electrochemical metallization-based transport in vertical transition metal dichalcogenide (TMD) memristors
R. Sasikumar,
Published in IEEE Computer Society
2020
Volume: 2020-July
   
Pages: 159 - 163
Abstract
Transition metal dichalcogenide (TMD) memris-tors with vertical transport and atomic scale inter-electrode distances have recently been reported. These devices demonstrate bipolar switching characteristics, with relatively low switching voltages. With multiple input sweeps, variability in switching behaviour is also seen. Our work models the transport in vertical TMD memristors, with a focus on explaining the current-voltage (I-V) characteristics and the associated variability, by analysing different current components. © 2020 IEEE.
About the journal
JournalData powered by TypesetProceedings of the IEEE Conference on Nanotechnology
PublisherData powered by TypesetIEEE Computer Society
ISSN19449399